Explore RWESCK Laboratories Advanced Characterization Services!
X-Ray Diffraction Analysis (XRD)
- Determine phase composition & crystal structure with precision
- Unlock the secrets of materials' atomic arrangements
Scanning Electron Microscopy (SEM)
- Analyze morphology for detailed insights
- Perform microanalysis for qualitative & quantitative elemental evaluation
The D2 PHASER is a portable desktop XRD instrument for all X-ray powder diffraction applications in Bragg-Brentano geometry for research and quality control
Thanks to its superior resolution as well as low-angle and low background, the instrument is the perfect solution for all powder diffraction applications from phase identification, and quantitative phase analysis, up to crystal structure analysis.
Scanning Electron Microscopy (SEM)
The Zeiss SEM EVO MA 15 Scanning electron microscopy (SEM) is an imaging technique with significance across multiple industries. SEM plays a pivotal role in various fields ranging from materials science and biology to electronics and forensics. Its ability to provide detailed insights into the composition and morphology of samples makes it an indispensable tool for research, quality control, and technological innovation in diverse sectors.
Trust RWESCK Lab for accurate results and in-depth material understanding. Elevate your research today!
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